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Beam Profiler Product List and Ranking from 6 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

Beam Profiler Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

  1. PRIMES Japan Kanagawa//Testing, Analysis and Measurement
  2. オフィールジャパン Tokyo//Electronic Components and Semiconductors
  3. エドモンド・オプティクス・ジャパン Tokyo//Optical Instruments
  4. 4 光貿易 Tokyo//Trading company/Wholesale
  5. 5 オプトロンサイエンス Tokyo//Optical Instruments
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Beam Profiler Product ranking

Last Updated： Aggregation Period:May 20, 2026～Jun 16, 2026
This ranking is based on the number of page views on our site.

  1. Focusing Beam Profiler "Focus Monitor FM+" PRIMES Japan
  2. EO Beam Profiler エドモンド・オプティクス・ジャパン
  3. High Power Laser Focusing Point Beam Profiler FBP-2KF 光貿易
  4. Slit-type beam profiler "Nanoscan Series" オフィールジャパン
  5. 4 Beam diagnosis (beam profiler) オプトロンサイエンス

Beam Profiler Product List

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High Power Laser Focusing Point Beam Profiler FBP-2KF

High Power Laser Focusing Point Beam Profiler FBP-2KF

Compact size 1KW high output laser beam profiler

Maximum Incident Power 1KW Focusing Point Beam Profiler The new FBP-2KF focusing point beam profiler from Cinogy is a CMOS camera-based beam profiler. It can measure minimum spots down to 64um. With a compact design and the option of a linear stage, it can automatically perform M2 measurements. The beam profiler software can be controlled and data can be imported from external software currently in use via an SDK. The power supply and interface are USB, with a measurement wavelength range of 320-1150nm and a pixel size of 5.3um x 5.3um. In addition to this, CINOGY offers a lineup that includes near-field pattern measurement devices and fully automatic focusing point beam profilers capable of measuring spot diameters down to 3um. ● The catalog for this product is described with overseas specifications. Please contact us separately for Japanese specifications.

  • Company：光貿易
  • Price：1 million yen-5 million yen
  • Laser Components
  • Beam Profiler

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[High Resolution, Large Area, Ultra-Compact] Beam Profiler BP Series

[High Resolution, Large Area, Ultra-Compact] Beam Profiler BP Series

User-friendly, low-cost, high-performance beam profiler with accompanying software.

- High resolution, element size 1.85 μm～ - Measurement wavelength 350～1100 nm (UV option: 190～1100 nm) - Large area measurement (11.2 × 11.2 mm, etc.) - Ultra-compact 36.1 x 39 x 46.1 mm - User-friendly software control - Software included The BP series from Femtoeasy is a low-cost, high-performance beam profiler capable of measuring beam parameters with high resolution. The included software, provided free of charge, makes it easy to use and facilitates straightforward beam analysis.

  • Analytical Equipment and Devices
  • Other physicochemical equipment
  • Optical Measuring Instruments
  • Beam Profiler

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Slit-type beam profiler "Nanoscan Series"

Slit-type beam profiler "Nanoscan Series"

Slit scan type! We have various sensors suitable for applications.

This series is a slit-scanning laser beam profiler. The NanoScan system features the advantages of slit scanning, offering sub-micron measurement accuracy and utilizing silicon, germanium, and pyroelectric detectors to accommodate a wide wavelength range. The software supports measurements compliant with numerous ISO standards, includes an M2 Wizard function, and can also measure laser output. 【Features】 ■ Slit scanning type ■ NanoScan system ・ Supports a wide wavelength range ■ Software ・ Supports measurements compliant with numerous ISO standards ・ Includes M2 Wizard function ・ Can measure laser output *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Beam Profiler

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EO Beam Profiler

EO Beam Profiler

All products are sold individually as standard specifications. We provide short delivery times due to complete stock availability.

The EO beam profiler is designed to measure a wide range of laser beam sizes. It features a 2.2-megapixel sensor that enables accurate profiling of small diameter beams, and the use of a wide area sensor allows for profiling of larger beam sizes as well. The accompanying software, which enables intuitive operation, can be easily operated and controlled on 2D or 3D displays, or XY displays, and is equipped with functions such as background correction, animation, Gaussian fitting, and semi-logarithmic graph display. This laser beam profiler, compliant with ISO standards, also supports external trigger input, allowing it to synchronize with cameras equipped with pulse lasers. This product, which can be connected via USB 2.0 or 3.0, achieves the fastest transfer rates in the industry. *You can download the catalog from Edmund Optics Japan that features this product from the link below.

  • Laser Components
  • Beam Profiler

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Beam diagnosis (beam profiler)

Beam diagnosis (beam profiler)

CMOS-based beam profiler covering the ultraviolet wavelength range to the infrared wavelength range.

■ PC Direct (USB 3.0 or higher) ■ Easy to use ■ Various options available

  • Other measurement, recording and measuring instruments
  • Beam Profiler

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Beam profiler "BeamWatch AM"

Beam profiler "BeamWatch AM"

All measurements are in real-time! It is possible to measure focal shift that occurs immediately after startup.

"BeamWatch AM" is a profiler designed to measure critical laser beam parameters for additive manufacturing using lasers or 3D printer systems. It allows simultaneous measurement of multiple profiles along the beam focusing curve within the camera's field of view (FOV). In real-time measurements, values such as "waist (focal spot) width and position," "focus shift," and "centroid" are measured at each video rate. It can measure focus shift from the moment the laser is turned on. 【Features】 ■ Simultaneous measurement of multiple profiles along the beam focusing curve within the camera's field of view ■ Real-time measurement enables focus shift measurement from the moment the laser is turned on ■ Equipped with a CCD camera and NIST-traceable power sensor necessary for beam spatial measurement ■ Capable of analyzing laser power density ■ Can measure focal shift that occurs immediately after startup *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Structural Analysis
  • Other analyses
  • Beam Profiler

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Non-collecting beam profiler "Beam Monitor BM+"

Non-collecting beam profiler "Beam Monitor BM+"

BM Series Latest Advanced Machine

The "Beam Monitor BM+" is a non-focusing measurement device equipped with the latest electronics, designed for measuring high-power CO2 lasers and solid-state lasers in continuous wave (CW) operation. By analyzing and documenting laser parameters, it can further optimize work processes and identify undesirable deviations caused by dirt, beam position shifts, and optical misalignments. 【Features】 ■ Direct measurement of raw beams ■ New tip design: measures beam divergence angles up to 200 mrad ■ Improved data transfer speed with Ethernet ■ Increased data management bits and enhanced functionality ■ New software adopted for improved operability ■ Contributes to increased productivity and reduced total costs in high-power laser processing ■ Detection of degradation and deviations 【Specifications】 ■ Aperture diameter: 60mm or 100mm ■ Wavelength: 450–1,090nm or 10,600nm ■ Input power: 50W to 25kW *For more details, please download the PDF or contact us.

  • Other measurement, recording and measuring instruments
  • Analytical Equipment and Devices
  • Beam Profiler

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Focusing Beam Profiler "Focus Monitor FM+"

Focusing Beam Profiler "Focus Monitor FM+"

FM series latest advanced model

The "Focus Monitor FM+" is a measurement device that can measure both the focusing area and defocusing area, making it ideal for analyzing high-power lasers and high-output density lasers. It measures beam characteristics of focused lasers, such as focal position, BPP, and M2, without attenuation. The HPD type, which adopts a synthetic quartz measurement chip and the innovative measurement principle FS3 (maximum power density: 50MW/cm²), has also been released. 【Features】 - Capable of measuring multi-kW green lasers and blue lasers - Caustic measurement (Z-axis: 120mm) - Easy installation allows for measurement at various wavelengths simply by swapping the rotating chip and detector - Improved data transfer speed with Ethernet adoption - Increased data management bits and enhanced functionality - New software adopted for improved operability 【Specifications】 - Wavelength: 400–1,600nm or 9–12μm - Input power: 30W–25kW - Beam diameter: 100–3,000μm - Maximum power density: NIR laser: 10MW/cm² CO2 laser: 30MW/cm² *For more details, please download the PDF or contact us.

  • Other environmental analysis equipment
  • Other analyses
  • Other measurement, recording and measuring instruments
  • Beam Profiler

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